Skip to main content
Dinnar
Back to products
Visual Inspection Equipment

Monocrystalline Wafer Cutting Blade Defect Detection

Built for high-precision, traceable inspection, this system detects notches on circular blades. Loading includes code-scan identification and sample cleaning before inspection, so each part is tracked and located and dirt or foreign matter does not affect inspection accuracy. It suits multi-model, high-precision inspection in the 3C and consumer-goods industries.

Monocrystalline Wafer Cutting Blade Defect Detection
Inspection speed
15 s

Specifications

Defect types
Cracks, notches
Suitable products
Cutting tools
Inspection method
Inline / offline
Inspection system
VisionOne software platform

Highlights

  • Automatically cleans the part fixture before every inspection to avoid secondary contamination

  • Ergonomic design: easy to operate and more efficient to work with

Typical application

Cutting-tool production lines

Interested in this product?

Contact our engineering team for pricing and technical details.

Talk to an engineer